BLAST-TNG features three detector arrays operating at wavelengths of 250, 350, and 500 m (1200, 857, and 600 GHz) comprised of 918, 469, and 272 dual-polarization pixels, respectively. Each pixel is made up of two crossed microwave kinetic inductance detectors (MKIDs). These arrays are cooled to 275 mK in a cryogenic receiver. Each MKID has a different resonant frequency, allowing hundreds of resonators to be read out on a single transmission line. This inherent ability to be frequency-domain multiplexed simplifies the cryogenic readout hardware, but requires careful optical testing to map out the physical location of each resonator on the focal plane. Receiver-level optical testing was carried out using both a cryogenic source mounted to a movable xy-stage with a shutter, and a beam-filling, heated blackbody source able to provide a 10-50 C temperature chop. The focal plane array noise properties, responsivity, polarization efficiency, instrumental polarization were measured. We present the preflight characterization of the BLAST-TNG cryogenic system and array-level optical testing of the MKID detector arrays in the flight receiver.
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