20 July 2018 C3TM: CEI CCD charge transfer model for radiation damage analysis and testing
Author Affiliations +
Radiation induced defects in the silicon lattice of Charge Couple Devices (CCDs) are able to trap electrons during read out and thus create a smearing effect that is detrimental to the scientific data. To further our understanding of the positions and properties of individual radiation-induced traps and how they affect space- borne CCD performance, we have created the Centre for Electronic Imaging (CEI) CCD Charge Transfer Model (C3TM). This model simulates the physical processes taking place when transferring signal through a radiation damaged CCD. C3TM is a Monte Carlo model based on Shockley-Read-Hall theory, and it mimics the physical properties in the CCD as closely as possible. It runs on a sub-electrode level taking device specific charge density simulations made with professional TCAD software as direct input. Each trap can be specified with 3D positional information, emission time constant and other physical properties. The model is therefore also able to simulate multi-level clocking and other complex clocking schemes, such as trap pumping.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jesper Skottfelt, Jesper Skottfelt, David J. Hall, David J. Hall, Ben Dryer, Ben Dryer, Ross Burgon, Ross Burgon, Andrew Holland, Andrew Holland, "C3TM: CEI CCD charge transfer model for radiation damage analysis and testing", Proc. SPIE 10709, High Energy, Optical, and Infrared Detectors for Astronomy VIII, 1070918 (20 July 2018); doi: 10.1117/12.2309944; https://doi.org/10.1117/12.2309944

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