Two-dimensional MTF characterization of a large format CMOS detector

Swaraj Bandhu Mahato; Joris De Ridder; Guy Meynants; Gert Raskin; Hans Van Winckel

doi:10.1117/12.2313012

Translator Disclaimer

16 July 2018 Two-dimensional MTF characterization of a large format CMOS detector

Swaraj Bandhu Mahato; Joris De Ridder; Guy Meynants; Gert Raskin; Hans Van Winckel

Author Affiliations +

Proceedings Volume 10709, High Energy, Optical, and Infrared Detectors for Astronomy VIII; 107092X (2018) https://doi.org/10.1117/12.2313012
Event: SPIE Astronomical Telescopes + Instrumentation, 2018, Austin, Texas, United States

Abstract

We are characterizing a 7638 x 5004 front-side illuminated CMOS detector for astronomical application. Mod- ulation Transfer Function (MTF) of a detector is considered as an important figure of merit for accurate target positioning in astronomy. It states the upper limit of the image quality. MTF knowledge also provides a better understanding of the design trade-off. In this work, two-dimensional (2D) sub-micrometer scanning method is used to extract 2D MTF profile of our CMOS detector with a pixel pitch of 6μm. Our optical measurement setup focuses a collimated beam onto the imaging surface with a microscope objective. The spot was scanned in a raster over a single pixel. We generate an oversampled point spread function (PSF) of the detector which contains sub-pixel elements. 2D MTF map is calculated from the measured oversampled PSF. This 2D MTF map is used to characterize the resolving ability of our detector. We analyze the importance of the 2D MTF map to describe the full pixel MTF of the CMOS pixel having low fill-factor. 1D MTFs are calculated from the 2d MTF to do a quantitative comparison of the MTF in horizontal and vertical directions. This study emphasizes advantages and necessity of the 2D MTF for CMOS detector performance analysis, especially for anisotropic resolution.

Citation Download Citation

Swaraj Bandhu Mahato, Joris De Ridder, Guy Meynants, Gert Raskin, and Hans Van Winckel "Two-dimensional MTF characterization of a large format CMOS detector", Proc. SPIE 10709, High Energy, Optical, and Infrared Detectors for Astronomy VIII, 107092X (16 July 2018); https://doi.org/10.1117/12.2313012

PROCEEDINGS
6 PAGES

DOWNLOAD PDF SAVE TO MY LIBRARY

SHARE

GET CITATION

< Previous Article

|

Next Article >

KEYWORDS

Modulation transfer functions

CMOS sensors

Sensors

Point spread functions

Image sensors

Imaging systems

RELATED CONTENT

Robust and efficient modulation transfer function measurement with CMOS color...
Proceedings of SPIE (June 26 2017)

Kernel based crosstalk quantification and analysis of a CMOS image...
Proceedings of SPIE (May 09 2018)

High-resolution CMOS imaging detector
Proceedings of SPIE (June 28 2001)

High-performance CMOS image sensors at BAE SYSTEMS Imaging Solutions
Proceedings of SPIE (September 25 2012)

Arc-section annular folded optic imager
Proceedings of SPIE (September 14 2007)

Effect of pixel active area shape on imaging quality of...
Proceedings of SPIE (January 24 2008)

Simulation of imaging system's performance
Proceedings of SPIE (January 22 2004)

Subscribe to Digital Library

Receive Erratum Email Alert

Keywords/Phrases

Search In:

Publication Years