23 May 1989 Optimizing Charge-Coupled Devices For Red And Near-Infrared Observations
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Proceedings Volume 1071, Optical Sensors and Electronic Photography; (1989); doi: 10.1117/12.952506
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
Methods to improve the red and near-IR quantum efficiency (QE) of CCDs are discussed. The effects of thinning, antireflection (AR) coating, and mounting CCDs for use in astronomical observations at wavelengths greater than 700 nm are presented. Thinning CCDs to inside their epitaxy and backside illuminating them increases their QE over thick devices even in the far red, due to the absence of frontside absorption and reflection losses. AR coatings decrease the backside reflection loss and greatly reduce the amplitudes of interference fringes. Mounting CCDs on a substrate eliminates surface warpage which improves the user's ability to correct for instrumental and background signatures. Some of these optimization techniques are demonstrated using the Photometrics PM512 CCD made by Ford Aerospace.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. P. Lesser, E. Olszewski, Gary R. Sims, Fabiola Griffin, "Optimizing Charge-Coupled Devices For Red And Near-Infrared Observations", Proc. SPIE 1071, Optical Sensors and Electronic Photography, (23 May 1989); doi: 10.1117/12.952506; https://doi.org/10.1117/12.952506
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KEYWORDS
Charge-coupled devices

Quantum efficiency

Antireflective coatings

Silicon

Coating

Sensors

Ultraviolet radiation

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