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17 September 2018 Enabling nanoscale detection of longitudinal and transverse chirality in photo-induced force microscopy using structured light (Conference Presentation)
Mohammad Albooyeh, Mohammad Kamandi, Mohsen Rajaei, Jinwei Zeng, H. K. Wickramasinghe, Filippo Capolino
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Proceedings Volume 10723, Optical Trapping and Optical Micromanipulation XV; 107231A (2018) https://doi.org/10.1117/12.2322805
Event: SPIE Nanoscience + Engineering, 2018, San Diego, California, United States
Abstract
We propose to engineer the excitation light in photo-induced force microscopy that enables the nanoscale detection of longitudinal and transverse (with respect to the propagation direction) components of chirality of samples. We employ an achiral tip in the vicinity of a chiral specimen, and illuminate the tip-sample interactive system with appropriate engineered structured light to explore both components. Particularly, we discuss using circularly polarized light to detect the transverse chirality, and the superposition of specifically-engineered radially and azimuthally polarized beams to detect longitudinal chirality. We obtain all the mentioned results through a rigorous theoretical analysis with several numerical examples. The proposed technique may have a high impact especially in biomedicine and pharmaceutics.
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Mohammad Albooyeh, Mohammad Kamandi, Mohsen Rajaei, Jinwei Zeng, H. K. Wickramasinghe, and Filippo Capolino "Enabling nanoscale detection of longitudinal and transverse chirality in photo-induced force microscopy using structured light (Conference Presentation)", Proc. SPIE 10723, Optical Trapping and Optical Micromanipulation XV, 107231A (17 September 2018); https://doi.org/10.1117/12.2322805
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KEYWORDS
Microscopy
Structured light
Structural engineering
Superposition
Systems engineering
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