Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions

K. Zembrzycki; T. A. Kowalewski; S. Pawlowska; J. Chrzanowska-Gizynska; M. Nowak; M. Walczak; F. Pierini

doi:10.1117/12.2319732

7 September 2018 Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions

K. Zembrzycki, T. A. Kowalewski, S. Pawlowska, J. Chrzanowska-Gizynska, M. Nowak, M. Walczak, F. Pierini

Author Affiliations +

Proceedings Volume 10723, Optical Trapping and Optical Micromanipulation XV; 1072323 (2018) https://doi.org/10.1117/12.2319732
Event: SPIE Nanoscience + Engineering, 2018, San Diego, California, United States

Abstract

Materials containing suspended micro- or nanomaterials are used extensively in multiple fields of research and industry. In order to understand the behavior of nanomaterials suspended in a liquid, the knowledge of particle stability and mobility is fundamental. For this reason, it is necessary to know the nanoscale solid-solid interaction and the hydrodynamic properties of the particles. In the presented research we used a hybrid Atomic Force Microscope coupled with Optical Tweezers system to measure the femtonewton scale interaction forces acting between single particles and the walls of a microchannel at different separation distances and environmental conditions. We show an important improvement in a typical detection system that increases the signal to noise ratio for more accurate position detection at very low separation distances.

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K. Zembrzycki, T. A. Kowalewski, S. Pawlowska, J. Chrzanowska-Gizynska, M. Nowak, M. Walczak, and F. Pierini "Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions", Proc. SPIE 10723, Optical Trapping and Optical Micromanipulation XV, 1072323 (7 September 2018); https://doi.org/10.1117/12.2319732

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