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14 September 2018 Characterization of an aspherical surface with null screens using exact ray tracing
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Abstract
One of the most used methods to measure the quality of optical surfaces by light transmission is the de ectometry. To implement this technique, an arbitrary ray selector is used to choose some incident rays. Measuring the intersection of the rays refracted by the surface, in a posterior detection plane perpendicular to the optical axis, the normal at the surface under test, it is determined. Whith measurement points, the shape of the surface is determined by their integration. The process is simple if the incident rays are chosen in a called null configuration, since it is expected that all refracted rays will strike a predetermined ordered array in the detection plane. To numerical calculation we using an ideal surface on this test. In order to full measuare of the surface on simulation, we used vector form of exact ray tracing. To carry out the necessary numerical simulations for a null screen, we considering a point light source and the selector placed in arbitrary position between the point source lens of the test. Some numerical simulations are shown and are compared with experimental results.
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© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Diana Castán-Ricaño, Fermín Granados-Agustín, Maximino Avendaño-Alejo, Elizabeth Percino-Zacarías, and Alejandro Cornejo-Rodríguez "Characterization of an aspherical surface with null screens using exact ray tracing", Proc. SPIE 10742, Optical Manufacturing and Testing XII, 107420Z (14 September 2018); https://doi.org/10.1117/12.2320782
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