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20 March 2019 Polarized reflectivity for quantitative crystallography of alpha-Titanium
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Abstract
A technique is introduced to extend traditional polarized-light microscopy to obtain quantitative c-axis orien- tation images of reflective non-cubic crystal grains such as a titanium. The technique is based on multiple generalized illumination and detection states in a laser polarimeter and a physical model mapping resulting im- age irradiance to crystal orientation, and is demonstrated by comparing relative-orientation images with EBSD orientation maps of a Ti-6Al-4V sample. The new technique is shown to be somewhat more tolerant than EBSD to mechanically-induced surface roughness and deformation, although grain contrast for a Ti-7Al sample was be only weakly correlated with roughness as measured by an AFM.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian G. Hoover, Jonathan H. Turner, Brian J. Ritter, Joseph R. Michael, and Michael D. Uchic "Polarized reflectivity for quantitative crystallography of alpha-Titanium", Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500D (20 March 2019); https://doi.org/10.1117/12.2321601
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