Polarized reflectivity for quantitative crystallography of alpha-Titanium

Brian G. Hoover; Jonathan H. Turner; Brian J. Ritter; Joseph R. Michael; Michael D. Uchic

doi:10.1117/12.2321601

20 March 2019 Polarized reflectivity for quantitative crystallography of alpha-Titanium

Brian G. Hoover, Jonathan H. Turner, Brian J. Ritter, Joseph R. Michael, Michael D. Uchic

Proceedings Volume 10750, Reflection, Scattering, and Diffraction from Surfaces VI; 107500D (2019) https://doi.org/10.1117/12.2321601
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

A technique is introduced to extend traditional polarized-light microscopy to obtain quantitative c-axis orien- tation images of reflective non-cubic crystal grains such as a titanium. The technique is based on multiple generalized illumination and detection states in a laser polarimeter and a physical model mapping resulting im- age irradiance to crystal orientation, and is demonstrated by comparing relative-orientation images with EBSD orientation maps of a Ti-6Al-4V sample. The new technique is shown to be somewhat more tolerant than EBSD to mechanically-induced surface roughness and deformation, although grain contrast for a Ti-7Al sample was be only weakly correlated with roughness as measured by an AFM.

Conference Presentation

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Brian G. Hoover, Jonathan H. Turner, Brian J. Ritter, Joseph R. Michael, and Michael D. Uchic "Polarized reflectivity for quantitative crystallography of alpha-Titanium", Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500D (20 March 2019); https://doi.org/10.1117/12.2321601

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