Polarized reflectivity for quantitative crystallography of alpha-Titanium

Brian G. Hoover; Jonathan H. Turner; Brian J. Ritter; Joseph R. Michael; Michael D. Uchic

doi:10.1117/12.2321601

20 March 2019 Polarized reflectivity for quantitative crystallography of alpha-Titanium

Brian G. Hoover, Jonathan H. Turner, Brian J. Ritter, Joseph R. Michael, Michael D. Uchic

Proceedings Volume 10750, Reflection, Scattering, and Diffraction from Surfaces VI; 107500D (2019) https://doi.org/10.1117/12.2321601
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

A technique is introduced to extend traditional polarized-light microscopy to obtain quantitative c-axis orien- tation images of reflective non-cubic crystal grains such as a titanium. The technique is based on multiple generalized illumination and detection states in a laser polarimeter and a physical model mapping resulting im- age irradiance to crystal orientation, and is demonstrated by comparing relative-orientation images with EBSD orientation maps of a Ti-6Al-4V sample. The new technique is shown to be somewhat more tolerant than EBSD to mechanically-induced surface roughness and deformation, although grain contrast for a Ti-7Al sample was be only weakly correlated with roughness as measured by an AFM.

Conference Presentation

Citation Download Citation

Brian G. Hoover, Jonathan H. Turner, Brian J. Ritter, Joseph R. Michael, and Michael D. Uchic "Polarized reflectivity for quantitative crystallography of alpha-Titanium", Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500D (20 March 2019); https://doi.org/10.1117/12.2321601

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