Comparison of resolution estimation methods in optical microscopy

Jakub Pospíšil; Karel Fliegel; Jan Švihlík; Miloš Klíma

doi:10.1117/12.2321301

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17 September 2018 Comparison of resolution estimation methods in optical microscopy

Jakub Pospíšil, Karel Fliegel, Jan Švihlík, Miloš Klíma

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Proceedings Volume 10752, Applications of Digital Image Processing XLI; 107522Q (2018) https://doi.org/10.1117/12.2321301
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

Super-resolution (SR) microscopy is a powerful technique which enhances the resolution of optical microscopes beyond the diffraction limit. Recent SR methods achieve the resolution of 100 nm. Theoretical resolution enhancement can be mathematically defined. However, the final resolution in the real image can be influenced by technical limitations. Evaluation of resolution in a real sample is essential to assess the performance of an SR technique. Several image based resolution limit evaluation methods exist, but the determination of cutoff frequency is still a challenging task. In order to compare the efficiency of assessing resolution methods, the reference estimation technique is necessary. There exist several conventional methods in digital image processing. In this paper, the most common resolution measurement techniques used in the optical microscopy imaging are presented and their performance compared.

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Jakub Pospíšil, Karel Fliegel, Jan Švihlík, and Miloš Klíma "Comparison of resolution estimation methods in optical microscopy", Proc. SPIE 10752, Applications of Digital Image Processing XLI, 107522Q (17 September 2018); https://doi.org/10.1117/12.2321301

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