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The ALS OSMS: Optical Surface Measuring System for high accuracy two-dimensional slope metrology with state-of-the-art x-ray mirrors
Testing of soft X-ray and EUV grazing incidence optics using compact laser plasma light sources (Conference Presentation)
Improving the thermodynamic stability and EUV reflectance in Mo/Si multilayer mirrors by rubidium incorporation (Conference Presentation)
Laser wakefield driven x-ray sources in Canada: a brillant future for agriculture and global food security
Monochromatic hard X-ray backlighting based on transmission logarithmic spiral crystals (Conference Presentation)