PROCEEDINGS VOLUME 10761
SPIE OPTICAL ENGINEERING + APPLICATIONS | 19-23 AUGUST 2018
Adaptive X-Ray Optics V
IN THIS VOLUME

5 Sessions, 12 Papers, 9 Presentations
Proceedings Volume 10761 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
19-23 August 2018
San Diego, California, United States
Front Matter: Volume 10761
Proc. SPIE 10761, Front Matter: Volume 10761, 1076101 (6 November 2018); doi: 10.1117/12.2516844
FEL Applications
Proc. SPIE 10761, Metrology of micron focusing KB mirrors for SPB/SFX instrument and preliminary commissioning results at European XFEL, 1076102 (18 September 2018); doi: 10.1117/12.2322979
Proc. SPIE 10761, The transform limited SXR monochromator with ultra-high-resolution option to open up new scientific capabilities at LCLS II (Conference Presentation), 1076103 (18 September 2018); doi: 10.1117/12.2322941
Proc. SPIE 10761, Shaping the mirror profile by using a novel cooling scheme to increase optical design flexibility in high power XFELs (Conference Presentation), 1076104 (18 September 2018); doi: 10.1117/12.2323216
Proc. SPIE 10761, Focusing optics system for the Time-resolved Molecular Optics (TMO) beam line at LCLS: surface metrology and mirror shape control of bendable mirror system, 1076105 (2 October 2018); doi: 10.1117/12.2323252
Metrology and Optical Simulations
Proc. SPIE 10761, Development of the new long trace profilometer at LCLS for bendable x-ray mirror metrology, 1076106 (17 October 2018); doi: 10.1117/12.2323293
Proc. SPIE 10761, Simulating the optical performances of the LCLS bendable mirrors using a 2D physical optics approach, 1076107 (18 September 2018); doi: 10.1117/12.2323253
Proc. SPIE 10761, Ex-situ metrology and data processing techniques developed at the ALS for optimization of beamline performance of bendable x-ray mirrors, 1076108 (18 September 2018); doi: 10.1117/12.2323218
New Device Development
Proc. SPIE 10761, Progress in development of adjustable optics for x-ray astronomy, 1076109 (26 October 2018); doi: 10.1117/12.2323283
Proc. SPIE 10761, Magnetostrictively deforming the surface of a silicon wafer at two locations, 107610B (18 September 2018); doi: 10.1117/12.2322511
At-Wavelength Metrology
Proc. SPIE 10761, Inspecting adaptive optics with at-wavelength wavefront metrology, 107610D (18 September 2018); doi: 10.1117/12.2320532
Proc. SPIE 10761, Developments of EUV/x-ray wavefront sensors and adaptive optics at Imagine Optic, 107610E (2 October 2018); doi: 10.1117/12.2320927
Proc. SPIE 10761, Ptychography simulations for precisely measuring wavefront profiles in soft x-ray focusing system based on ellipsoidal mirror, 107610F (18 September 2018); doi: 10.1117/12.2320961
Proc. SPIE 10761, Compact metrology beamline for EUV optic and adaptive optic tests (Conference Presentation), 107610G (18 September 2018); doi: 10.1117/12.2323768
Proc. SPIE 10761, Real-time feedback for x-ray adaptive optics with an interferometric absolute distance sensor array, 107610H (18 September 2018); doi: 10.1117/12.2323698
Proc. SPIE 10761, Micro-focusing of broadband high-order harmonic radiation by a double toroidal mirror (Conference Presentation), 107610I (18 September 2018); doi: 10.1117/12.2323770
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