15 August 1989 Analysis and Measurement of the Visual Resolution from Shadow Mask CRT Displays
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Abstract
A linear systems model has been developed for determining resolution capabilities provided by any shadow mask (SM) CRT-observer configuration. A square wave model is used to simulate both the sampling of the SM and the spatial phase difference between the displayed image and the SM holes. Due to the spatial phase differences for a selected SM CRT-observer configuration, distributions of calculated modulation depths are obtained. This analysis supports the notion that to meaningfully specify and measure the resolution of SM CRTs, characteristic of the luminance profiles prior to SM sampling must be obtained. To this end efficient measurement techniques were developed that provide accurate modulation depth values of the unsampled luminance profiles from the sampled luminance profiles obtained at the CRT surface.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. Veron, H. Veron, J. P. O'Callaghan, J. P. O'Callaghan, R. V. Labonte, R. V. Labonte, H. C. Masterman, H. C. Masterman, } "Analysis and Measurement of the Visual Resolution from Shadow Mask CRT Displays", Proc. SPIE 1077, Human Vision, Visual Processing, and Digital Display, (15 August 1989); doi: 10.1117/12.952696; https://doi.org/10.1117/12.952696
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