19 May 1989 Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films
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Proceedings Volume 1078, Optical Data Storage Topical Meeting; (1989) https://doi.org/10.1117/12.952759
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Abstract
Low conductivity, laser-irradiated thin films such as the chalcogenides employed for optical data storage can display manifestations of signific ant through-thickness thermal gradients. A combined Laplace-transform, Fourier-integral method was utilized to derive the temperature distributions in laser-irradiated, low conductivity thin films, and the results were used to examine the effects of some marking parameters on through-thickness thermal gradients. These were found to be strongly influenced by the laser incidence direction, the coefficient of optical absorption, and the film thickness, and influe:aced to a somewhat lesser degree by the scanning velocity.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian J. Bartholomeusz, "Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films", Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); doi: 10.1117/12.952759; https://doi.org/10.1117/12.952759
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