19 May 1989 Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films
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Proceedings Volume 1078, Optical Data Storage Topical Meeting; (1989) https://doi.org/10.1117/12.952759
Event: OE/LASE '89, 1989, Los Angeles, CA, United States
Low conductivity, laser-irradiated thin films such as the chalcogenides employed for optical data storage can display manifestations of signific ant through-thickness thermal gradients. A combined Laplace-transform, Fourier-integral method was utilized to derive the temperature distributions in laser-irradiated, low conductivity thin films, and the results were used to examine the effects of some marking parameters on through-thickness thermal gradients. These were found to be strongly influenced by the laser incidence direction, the coefficient of optical absorption, and the film thickness, and influe:aced to a somewhat lesser degree by the scanning velocity.
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Brian J. Bartholomeusz, Brian J. Bartholomeusz, "Manifestations Of Through Thickness Thermal Gradients In Laser Irradiated Thin Films", Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); doi: 10.1117/12.952759; https://doi.org/10.1117/12.952759

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