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16 November 2018 Extensive time-resolved investigation of laser-induced damage fatigue of single layer dielectric coating
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Abstract
The decrease of laser-induced damage threshold (LIDT) when exposed with high number of laser pulses is a well-known phenomenon in dielectrics. In the femtosecond regime this fatigue is usually attributed to the accumulation of laser-induced lattice defects. Little is known about the accumulation mechanisms in oxides used for dielectric coatings. In this work, S-on-1 laser-induced damage threshold test was combined with time-resolved digital holography in order to investigate laser-induced lattice defects in Nb2O5 single layer. The results provided insights into the current understanding of accumulation of laser-induced defects.
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Linas Smalakys, Balys Momgaudis, Mikas Vengris, Robertas Grigutis, and Andrius Melninkaitis "Extensive time-resolved investigation of laser-induced damage fatigue of single layer dielectric coating", Proc. SPIE 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference, 108050Z (16 November 2018); https://doi.org/10.1117/12.2500337
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