Translator Disclaimer
Paper
16 November 2018 A comparison of LIDT behavior of AR-coated yttrium-aluminium-garnet substrates with respect to thin-film design and coating technology
Author Affiliations +
Abstract
Several sets of polished substrates were manufactured from monocrystalline yttrium-aluminium-garnet (YAG) grown by the Czochralski method. Samples were coated by both narrow-band and broad-band dielectric anti-reflection (AR) thin-film system prepared using either reactive or ion-assisted e-beam deposition technology and tested for laser-induced damage threshold (LIDT) at 1030 nm 10 ns in s-on-1 mode according to the ISO 21254 standard. Measured damage thresholds at normal (0 deg) incidence were compared for different thin-film designs and coating technology.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Štěpán Uxa, Václav Škoda, Jan Vanda, and Mihai-George Muresan "A comparison of LIDT behavior of AR-coated yttrium-aluminium-garnet substrates with respect to thin-film design and coating technology", Proc. SPIE 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference, 108051R (16 November 2018); https://doi.org/10.1117/12.2500189
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
Back to Top