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1 October 2018 Spectroscopic ellipsometry measurements and nanocharacterization of conductive graft copolymer thin films
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Proceedings Volume 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018; 108080U (2018) https://doi.org/10.1117/12.2501582
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 2018, Wilga, Poland
Abstract
This work presents an investigation on the influence of different factors on conductive graft comb copolymer polymethylsiloxane (PMS) with poly(3-hexyltiophene) (P3HT) and poly(ethylene) glycol (PEG) or dodec-1-en as functional side groups grafted on poly(methylhydrosiloxane) backbone. The analysed factors that influenced the parameters of the layers were temperature and different gas atmosphere (N2, NO2). Samples were measured by spectroscopic ellipsometry under the influence of a gas atmosphere. Moreover, morphology (sample roughness) and optical properties (refractive index, extinction coefficient) were measured of obtained thin films deposited on glass substrate using spin coating method. The study showed that obtained thin films of copolymers shows the possibility of using such polymers in the implementation of gas sensing structures.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Kałużyński, Z. Opilski, A. Stolarczyk, and K. Gworek "Spectroscopic ellipsometry measurements and nanocharacterization of conductive graft copolymer thin films", Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 108080U (1 October 2018); https://doi.org/10.1117/12.2501582
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