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2 November 2018 Automated optoelectronic system for diagnostics of optical variable devices
Vasily Kolyuchkin; Ivan Tsyganov; Sergey Odinokov; Vladimir Talalaev; Vsevolod Cheburkanov
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Proceedings Volume 10818, Holography, Diffractive Optics, and Applications VIII; 108181C (2018) https://doi.org/10.1117/12.2327007
Event: SPIE/COS Photonics Asia, 2018, Beijing, China
Abstract
Optically variable devices (OVD), otherwise called security holograms are widely used to protect IDs and other sensitive documents against counterfeiting. That being said, the problem of quick authenticity verification and quality control remain to be of utmost importance. This paper presents a prototype of the automated optical-electronic device for OVD authentication and quality control, as a complex solution. Developed device allows to conduct both quick preliminary hologram inspection, which is based on photometric image analysis, and in-depth hologram analysis. In-depth analysis implies microrelief parameters, like spatial frequency, relief depth, grating orientation measurements, using light intensity distribution in diffraction orders and the formed pattern of diffraction orders.
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Vasily Kolyuchkin, Ivan Tsyganov, Sergey Odinokov, Vladimir Talalaev, and Vsevolod Cheburkanov "Automated optoelectronic system for diagnostics of optical variable devices", Proc. SPIE 10818, Holography, Diffractive Optics, and Applications VIII, 108181C (2 November 2018); https://doi.org/10.1117/12.2327007
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