PROCEEDINGS VOLUME 10819
SPIE/COS PHOTONICS ASIA | 11-13 OCTOBER 2018
Optical Metrology and Inspection for Industrial Applications V
Proceedings Volume 10819 is from: Logo
SPIE/COS PHOTONICS ASIA
11-13 October 2018
Beijing, China
Front Matter: Volume 10819
Proc. SPIE 10819, Front Matter: Volume 10819, 1081901 (14 December 2018); doi: 10.1117/12.2521846
Optical Metrology Methods I
Proc. SPIE 10819, A new phase unwrapping method for phase shifting profilometry with object in motion, 1081903 (2 November 2018); doi: 10.1117/12.2502644
Proc. SPIE 10819, Modulated rubidium-cesium laser system with dual wavelengths, 1081904 (7 November 2018); doi: 10.1117/12.2502280
Proc. SPIE 10819, Research on the displacement characteristic of piezoelectric transducer, 1081905 (26 December 2018); doi: 10.1117/12.2505462
Optical Metrology Methods II
Proc. SPIE 10819, Direct phase determination using simple phase lock loop for heterodyne displacement-measuring interferometers, 1081907 (6 November 2018); doi: 10.1117/12.2500626
Proc. SPIE 10819, Robustness evaluation of the non-contact inner diameter measuring device with micrometer order accuracy, 1081908 (6 November 2018); doi: 10.1117/12.2501020
Proc. SPIE 10819, Polarization aberration measurement of lithographic tools, 1081909 (7 November 2018); doi: 10.1117/12.2500778
Optical Metrology Methods III
Proc. SPIE 10819, Phase determination method for sinusoidal frequency/phase modulation displacement measuring interferometer, 108190C (7 November 2018); doi: 10.1117/12.2501026
Proc. SPIE 10819, 3D label free bio-transfer standards, 108190D (7 November 2018); doi: 10.1117/12.2501258
Proc. SPIE 10819, 2D refractive index field measurements in air in different pressure scenarios, 108190E (2 November 2018); doi: 10.1117/12.2500315
Optical Metrology Methods IV
Proc. SPIE 10819, High-speed 3D shape measurement using composite structured-light patterns and multiview system, 108190G (2 November 2018); doi: 10.1117/12.2500696
Proc. SPIE 10819, Fast 3D foot modeling based on simulated laser speckle projection stereo and silhouette, 108190H (2 November 2018); doi: 10.1117/12.2502429
Proc. SPIE 10819, 3D reconstruction of particle agglomerates using multiple scanning electron microscope stereo-pair images, 108190I (6 November 2018); doi: 10.1117/12.2502485
Proc. SPIE 10819, Semiconductor wafer surface defect inspection algorithm based on multi-frame differential image summation, 108190J (2 November 2018); doi: 10.1117/12.2502602
Optical Metrology Methods V
Proc. SPIE 10819, Dimensional measurement of internal profile using the optical caliper, 108190K (2 November 2018); doi: 10.1117/12.2501027
Proc. SPIE 10819, AM0 performance measurement of triple-junction GaInP/InGaAs/Ge solar cells by a compound light source, 108190L (8 November 2018); doi: 10.1117/12.2502513
Proc. SPIE 10819, Compact lateral shearing interferometer based on circular modified Hartmann mask, 108190M (2 November 2018); doi: 10.1117/12.2501010
Proc. SPIE 10819, Advanced signal processing in a white-light scanning interferometer for exact surface profile measurement, 108190N (8 November 2018); doi: 10.1117/12.2502790
Proc. SPIE 10819, Automatic control of LED light source for wafer height leveling in electron beam imaging systems, 108190O (8 November 2018); doi: 10.1117/12.2503470
Proc. SPIE 10819, Development of high accuracy in-situ measurement system for spectral reflectance of thermal control coatings, 108190P (8 November 2018); doi: 10.1117/12.2503691
Optical Metrology Applications I
Proc. SPIE 10819, Robotic visual servoing using fringe projection profilometry, 108190Q (7 November 2018); doi: 10.1117/12.2500629
Proc. SPIE 10819, Extraction of properties of individual component for the retarder-linear diattenuator-retarder system and its application, 108190R (2 November 2018); doi: 10.1117/12.2500465
Proc. SPIE 10819, Rotation axis estimation for the derotator calibration with machine vision measurement of the auxiliary laser, 108190S (2 November 2018); doi: 10.1117/12.2500549
Proc. SPIE 10819, Robust direct vision-based pose tracking using normalized mutual information, 108190T (2 November 2018); doi: 10.1117/12.2500857
Optical Metrology Applications II
Proc. SPIE 10819, Digital sinusoidal fringe generation with defocusing for profilometry: exponential binary vs squared binary patterns, 108190V (2 November 2018); doi: 10.1117/12.2500179
Proc. SPIE 10819, Holistic dimensional measurement of sheet-bulk metal formed parts, 108190W (8 November 2018); doi: 10.1117/12.2501255
Proc. SPIE 10819, Application of hyperspectral imaging on aircraft damage inspection, 108190X (7 November 2018); doi: 10.1117/12.2500378
Proc. SPIE 10819, Novel methods for inspection of damage on airframes, 108190Y (6 November 2018); doi: 10.1117/12.2500379
Proc. SPIE 10819, Quantitative measurement of embedding depth of internal defect using phase-shifting dual-observation digital shearography, 108190Z (2 November 2018); doi: 10.1117/12.2326956
Optical Metrology Applications III
Proc. SPIE 10819, Damping measurement using laser self-mixing interference with spectrum analysis, 1081910 (7 November 2018); doi: 10.1117/12.2502438
Proc. SPIE 10819, Cylindrical surface measurement, 1081911 (8 November 2018); doi: 10.1117/12.2501186
Proc. SPIE 10819, Precision measurement of specular spherical surfaces based on monoscopic phase measuring deflectometry, 1081912 (2 November 2018); doi: 10.1117/12.2500767
Proc. SPIE 10819, 850nm gain-switched pulse laser and its application in photon counting OTDR, 1081915 (2 November 2018); doi: 10.1117/12.2502081
Poster Session
Proc. SPIE 10819, Ambient aerosols identification based on polarization indices during a field test, 1081916 (8 November 2018); doi: 10.1117/12.2501101
Proc. SPIE 10819, Multi-ring artifact for performance evaluation experiments on probing system combinations, 1081917 (9 November 2018); doi: 10.1117/12.2323647
Proc. SPIE 10819, A timeline-based sampling method applied in National Institute of Metrology primary standard goniophotometer, 1081918 (2 November 2018); doi: 10.1117/12.2325366
Proc. SPIE 10819, Pose calibration of two cameras with non-overlapped field of view, 1081919 (2 November 2018); doi: 10.1117/12.2326700
Proc. SPIE 10819, Automatic 3D visualization and paper pop-up parts fabrication of construction model by recognizing 2D image of floor plan, 108191B (2 November 2018); doi: 10.1117/12.2500019
Proc. SPIE 10819, Optical model of hyperparaboloid mirror surface measurment based on PMD method, 108191C (2 November 2018); doi: 10.1117/12.2500188
Proc. SPIE 10819, Extraction of surface topography features of optical elements by contourlet transform, 108191E (2 November 2018); doi: 10.1117/12.2500437
Proc. SPIE 10819, Selection of frequency domain filter based on match of different location-specific points, 108191F (2 November 2018); doi: 10.1117/12.2500637
Proc. SPIE 10819, Quantitative reconstruction of 3D flow density fields by a direct computerized tomography method of BOS, 108191I (8 November 2018); doi: 10.1117/12.2500760
Proc. SPIE 10819, An improved SFS method for civil aviation engine 3D borescope inspection, 108191J (6 November 2018); doi: 10.1117/12.2500820
Proc. SPIE 10819, A turbulence image restoration algorithm for subpixel position of location holes on nuclear fuel assemblies, 108191K (7 November 2018); doi: 10.1117/12.2500836
Proc. SPIE 10819, An image enhancement method for visual inspection of nuclear fuel assemblies, 108191L (2 November 2018); doi: 10.1117/12.2500851
Proc. SPIE 10819, Fourier transform profilometry based on convolution neural network, 108191M (7 November 2018); doi: 10.1117/12.2500884
Proc. SPIE 10819, Quantitative measurement of colored-fringe background oriented schlieren based on three-step phase shifting, 108191N (6 November 2018); doi: 10.1117/12.2500908
Proc. SPIE 10819, Accuracy evaluations of axial localisation algorithms in confocal microscopy, 108191O (6 November 2018); doi: 10.1117/12.2501031
Proc. SPIE 10819, Calibration of monochromator wavelength based on continuous spectrum light source and Fourier transform spectroradiometer, 108191P (7 November 2018); doi: 10.1117/12.2501177
Proc. SPIE 10819, UV laser wavelength standard based on frequency doubling of He-Ne laser at 632.8 nm, 108191Q (7 November 2018); doi: 10.1117/12.2501206
Proc. SPIE 10819, Surface measurement of axicon lens based on polarization phase-shifting interferometry, 108191R (6 November 2018); doi: 10.1117/12.2501224