Method for calibrating transmitted wavefront at any wavelength by refractive index formula

Qiyuan Zhang; Sen Han; Haoyu Wang; Quanzhao Wang

doi:10.1117/12.2511225

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6 November 2018 Method for calibrating transmitted wavefront at any wavelength by refractive index formula

Qiyuan Zhang, Sen Han, Haoyu Wang, Quanzhao Wang

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Proceedings Volume 10819, Optical Metrology and Inspection for Industrial Applications V; 108191Z (2018) https://doi.org/10.1117/12.2511225
Event: SPIE/COS Photonics Asia, 2018, Beijing, China

Abstract

Testing wavefront distortions at the design wavelength is critical for optical system qualification. The wavefront aberrations is usually expressed in the Zernike polynomials form. As the available wavelength of the laser is limited, wavefronts of an optical system at only a few wavelengths can be test precisely. We consider the change in wavefront with wavelength is caused by the change in the refractive index of the optical material. In this paper we put forward a method for calibrating transmitted wavefront at any wavelength within certain limits. Transmitted wavefronts can be estimated at any wavelength utilizing the relationship between transmitted wavefront and wavelength. We study the relationship between transmitted wavefront Zernike coefficients and wavelength, and choose the Conrady formula to express the function of Zernike coefficients and wavelengths. Zernike coefficients at any wavelength in a certain range can be calculated by the Conrady formula at three other wavelengths. The transmitted wavefront at a specific wavelength can be fitted. Finally, we verify different kinds of optical systems by this method. The result shows the method is effective for the monochromatic system and the achromatic system, while the apochromatism system is form with special glass. The relationship between of the transmitted wavefront Zernike coefficients and wavelength is more complex.

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Qiyuan Zhang, Sen Han, Haoyu Wang, and Quanzhao Wang "Method for calibrating transmitted wavefront at any wavelength by refractive index formula", Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 108191Z (6 November 2018); https://doi.org/10.1117/12.2511225

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