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7 November 2018 Super-resolution imaging in thick scattering samples by structured illumination microscopy with dual nonlinear effects
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Proceedings Volume 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications; 108320K (2018) https://doi.org/10.1117/12.2506679
Event: Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 2018, Changchun, China
Abstract
High-resolution, real-time and three-dimensional imaging in thick scattering specimens is of great significance in biology, yet meeting these requirements at the same time is fraught with challenges. In this work, we describe a method that combines structured illumination microscopy (SIM) with dual nonlinear effects, two-photon excitation (2PE) technique and stimulated emission depletion (STED), to further improve the imaging resolution in optical-thick samples relative to SIM. Utilizing a line-scanning geometry shaped by cylindrical lens to form structured illumination pattern, the imaging speed is greatly improved. Theoretical study and simulations are both performed to demonstrate the capability of this method to enhance resolution laterally and the potential for applications in real-time imaging for living tissue.
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Shurong Jiang, Yanhui Wang, Fan Liu, Qingru Li, and Han Zhang "Super-resolution imaging in thick scattering samples by structured illumination microscopy with dual nonlinear effects", Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108320K (7 November 2018); https://doi.org/10.1117/12.2506679
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