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7 November 2018 Background radiation response evaluation of InGaAs detectors
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Proceedings Volume 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications; 108321Q (2018) https://doi.org/10.1117/12.2511867
Event: Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 2018, Changchun, China
Abstract
The basic principle of evaluating the background radiation response of the InGaAs detector is introduced. Based on the structure characteristics of the InGaAs detector, the background radiation response calculation model is established. A background radiation response assessment scheme was designed and a test system was designed. Based on the effect of dark current output of the detector, the background radiation output of the InGaAs detector at different temperatures was measured. The results showed that the theoretical calculations of the background radiation response were consistent with the measured values. It provides data support for setting and parameter evaluation of InGaAs detector conditions.
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Hao Dong, Zhenghai Liu, Peng Zou, and Jin Hong "Background radiation response evaluation of InGaAs detectors", Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108321Q (7 November 2018); https://doi.org/10.1117/12.2511867
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