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18 January 2019 Research and design of synchronous phase shifting optical profile detection system
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Proceedings Volume 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment; 108390H (2019) https://doi.org/10.1117/12.2504890
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China
Abstract
With the ever-increasing use of optical products, the demand to precision of lens manufacturing is more and more strict. In order to improve the precision, we should not only improve the grinding technology, the more important one is the improvement of detecting technology. With the application of surface deviation detection method, we could improve the lens surface accuracy efficiently. In addition, how to finish the precision detection in harsh environment has a very important significance for outdoor debugging assembly and workshop online detection. In this essay, we introduced a synchronous phase shifting optical surface detection system on the basis of Tyman-Green interference light path. It will solve the problem that the system is affected by the environmental disturbance and decrease the detection precision. We used two-dimensional grating as light splitting component, the polarization matrix as the phase shifting element to realize the acquisition of four polarization images with fixed phase difference at the same time, which can eliminate the influence of the environmental disturbance and improve the detection accuracy by the software algorithm. In order to provide the conditions for the system to detect the lens in the harsh environment and the online detection of the lens in the workshop.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yaolin Huang, Chengkai Ding , Min Wang, and Xiaoping Shao "Research and design of synchronous phase shifting optical profile detection system", Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390H (18 January 2019); https://doi.org/10.1117/12.2504890
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