31 July 1989 Vibration Analysis Using Phase Stepped Pulsed Electronic Speckle Pattern Interferometry
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Proceedings Volume 1084, Stress and Vibration: Recent Developments in Industrial Measurement and Analysis; (1989) https://doi.org/10.1117/12.952924
Event: Sira/Stress and Vibration: Recent Developments in Measurement and Analysis, 1989, London, United Kingdom
Abstract
Electronic Speckle Pattern Interferometry (ESPI) used with cw lasers has so far proved useful only as a laboratory research tool, requiring restrictive environmental conditions and specialist knowledge at the data interpretation stage. A pulsed laser eliminates the need for such requirements mainly due to its shorter pulse duration. The incorporation of a pulsed laser into ESPI provides the high quality fringe data needed to meet the stringent demands of industrial modal analysis. Results obtained with ESPI incorporating a pulsed Neodinium/YAG laser (working at 0.532 μm) are reported in this paper, where the technique was applied to deformation and vibration studies of object areas up to 0.5 m2 in size. The fringe patterns produced are analysed by a phase reduction method to yield out-of-plane amplitude data. The method is easily extended to in-plane sensitivity with very little additional optics. These data may be presented in the form of three dimensional surface displacement maps which may be manipulated by computer for combination with other modal analysis equipment. With the introduction of pulsed laser and a dedicated fringe analysis software and hardware package, ESPI has -now become a commercially viable industrial measurement and analysis tool. A complete description of the system is presented here emphasizing the relevance of the above points and their direct practical applications.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
F. Mendoza Santoyo, J. R. Tyrer, T. C. West, D. Kerr, "Vibration Analysis Using Phase Stepped Pulsed Electronic Speckle Pattern Interferometry", Proc. SPIE 1084, Stress and Vibration: Recent Developments in Industrial Measurement and Analysis, (31 July 1989); doi: 10.1117/12.952924; https://doi.org/10.1117/12.952924
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