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30 January 2019 New insights into Fourier analysis on plane and convex holographic gratings for imaging spectrometers
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Proceedings Volume 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics; 1084104 (2019) https://doi.org/10.1117/12.2505122
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China
Abstract
As an optical element, diffraction grating is of considerable importance in many research fields. In this paper, Fourier analysis method is used to analyze the Fraunhofer diffraction phenomena of plane and convex holographic gratings under various conditions. Based on the transmittance function, the law of complex amplitude distribution, intensity distribution and spectral distribution on the diffraction screen is derived. For the planar and convex holographic gratings in the spectrometer design, the inherent laws of optical phenomena can be understood more deeply. In particular, the convex holographic gratings are analyzed as a combination of amplitude type plane grating and phase type spherical mirror, rather than being considered separately in most literature.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Keming Zhang, Yinnian Liu, Youlong Ke, Yong Li, and Min Xu "New insights into Fourier analysis on plane and convex holographic gratings for imaging spectrometers", Proc. SPIE 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics, 1084104 (30 January 2019); https://doi.org/10.1117/12.2505122
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