A new blind-pixel detection method for 384×288 long-wave infrared focal plane arrays images

Wenxiu Wang; Tianyou Zhu; Yu-tian Fu; Feng Dong

doi:10.1117/12.2514707

8 February 2019 A new blind-pixel detection method for 384×288 long-wave infrared focal plane arrays images

Wenxiu Wang, Tianyou Zhu, Yu-tian Fu, Feng Dong

Proceedings Volume 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging; 108431T (2019) https://doi.org/10.1117/12.2514707
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

We propose a blind-pixel detection method based on Visual Features-Statistics(VFS), which efficiently locate random bad pixels and fixed bad pixels, which including two steps. First of all, we input one image into our system. An initial detection method based on the visual characteristics is used on the image, which is used to mark the location of the pixel obviously below or higher than the other pixel values. Second, as the multi frame images are read in, the pixel position information is accumulated. At this very moment, we obtain the position weight and its histogram information. According to the confidence coefficient of the weight histogram, the blind-pixel was divided into three grades: grade 1 blind-pixels, grade 2 blind-pixels and graded 3 blind-pixels, in which, grade 3 are normal pixels. We classify the grades by the confidence boundary 0.99 and 0.95. We compensation different grade blind-pixels to meet our demand in image. By experiment, we found that our method based on visual features have detected the blind-pixels accurately, and used for many occasion. At the same time, our method maintains more details and point target information, which is suitable for software and hardware implementation.

Citation Download Citation

Wenxiu Wang, Tianyou Zhu, Yu-tian Fu, and Feng Dong "A new blind-pixel detection method for 384×288 long-wave infrared focal plane arrays images", Proc. SPIE 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging, 108431T (8 February 2019); https://doi.org/10.1117/12.2514707

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