Translator Disclaimer
12 December 2018 Effect for an anti-ASE cap thickness on pump spot uniformity in a thin disk laser
Author Affiliations +
Proceedings Volume 10844, Advanced Laser Technology and Applications; 108440Q (2018) https://doi.org/10.1117/12.2505375
Event: International Symposium on Optoelectronic Technology and Application 2018, 2018, Beijing, China
Abstract
For high power thin disk laser (TDL), the anti-amplified spontaneous emission (ASE) cap is one of the effective methods to suppress the ASE effect. Thermal aberration and dioptric power of the capped disk was stronger than that of the uncapped disk. With a particular anti-ASE cap thickness the dioptric power of the capped disk almost keeps constant with the increase of pump power density. However, the pump spot uniformity of a thin disk laser will be changed if the anti-ASE cap is thick enough. A numerical model developed to analyze the pump spot uniformity for different thickness anti-ASE caps. The analysis results show that the thickness of the anti-ASE cap will deteriorate the pump spot uniformity. Thus, weighing pump spot uniformity will be important for designing an anti-ASE cap (YAG, n=1.82) with an optimal thickness to realize higher-power laser generation.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liu Rui, Zhang Xihe, Faquan Gong, Jia Yong, Songwen Deng, Yuqi Jin, and Gang Li "Effect for an anti-ASE cap thickness on pump spot uniformity in a thin disk laser", Proc. SPIE 10844, Advanced Laser Technology and Applications, 108440Q (12 December 2018); https://doi.org/10.1117/12.2505375
PROCEEDINGS
5 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Optical refrigeration of Tm:YLF and Ho:YLF crystals
Proceedings of SPIE (March 07 2016)
Development of active elements for high-power disk laser
Proceedings of SPIE (February 17 2011)
High-power continuous-wave UV generation
Proceedings of SPIE (May 04 1999)
High power thin disk Ho:YAG laser
Proceedings of SPIE (February 15 2011)

Back to Top