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12 December 2018 Effect of electron scrubbing on gain and dynamic range of microchannel plate
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Proceedings Volume 10846, Optical Sensing and Imaging Technologies and Applications; 1084622 (2018) https://doi.org/10.1117/12.2505332
Event: International Symposium on Optoelectronic Technology and Application 2018, 2018, Beijing, China
Abstract
Electron scrubbing is an effective method of degassing the microchannel plate(MCP). In the present work, we investigated the effect of electron scrubbing on MCP through characterizing the gain and dynamic range during and after the electron scrubbing. The gain of the MCP decreases to 25-30% of the initial gain with 28μA·h of electron scrubbing. The dynamic range can be broadened by electron scrubbing. The lower limit of the dynamic range of the MCP limited by the dark current of the test system does not change significantly and the upper limit of the dynamic response range is increased. The ratio of the upper limit before and after scrubbing is inversely proportional to that of the gain. The reasons for variation of gain and dynamic range were discussed, to provide reference for improving the performance of microchannel plate.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiao Lian, Yong Sun, Xian Zhang, Yuechong Feng, Tiezhu Bo, Tao Xu, Xiaoxuan Shi, Hua Cai, and Hui Liu "Effect of electron scrubbing on gain and dynamic range of microchannel plate", Proc. SPIE 10846, Optical Sensing and Imaging Technologies and Applications, 1084622 (12 December 2018); https://doi.org/10.1117/12.2505332
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