Nanoscale imaging of biological samples with responsivity corrected Atomic Force Microscopy-Infrared (AFM-IR) spectroscopy

Seth Kenkel; Rohit Bhargava

doi:10.1117/12.2510131

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5 March 2019 Nanoscale imaging of biological samples with responsivity corrected Atomic Force Microscopy-Infrared (AFM-IR) spectroscopy

Seth Kenkel, Rohit Bhargava

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Proceedings Volume 10891, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI; 108910A (2019) https://doi.org/10.1117/12.2510131
Event: SPIE BiOS, 2019, San Francisco, California, United States

Abstract

Atomic Force Microscopy – Infrared spectroscopy (AFM-IR) is a powerful technique for mapping material composition at sub micrometer length scales. Unlike related technologies such as scanning near-field optical microscopy (SNOM), the detected signal can be equally sensitive to both chemical and mechanical sample properties due to variations in the cantilever’s response (or responsivity) to a sample perturbation local to the tip. Understanding cantilever responsivity has led to new approaches for correcting this effect, which show improved chemical specificity and imaging fidelity for heterogeneous samples. Here, we present implications of correcting the cantilever responsivity effect in AFM-IR images for studying biological samples at nanometer length scales and discuss the future of this emerging technology.

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Seth Kenkel and Rohit Bhargava "Nanoscale imaging of biological samples with responsivity corrected Atomic Force Microscopy-Infrared (AFM-IR) spectroscopy", Proc. SPIE 10891, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI, 108910A (5 March 2019); https://doi.org/10.1117/12.2510131

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