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1 March 2019 Interferometric detection for terahertz microscopy
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Abstract
We describe an implementation of continuous wave microscopy in the millimeter - terahertz wave region in with phase imaging is realized using a simple low cost detection scheme. Samples are illuminated using a Backward Wave Oscillator system and a detection scheme is presented in which soft or semitransparent samples are imaged in reflection or transmission using an interferometer. The main advantage of this approach is that simple pyroelectric detectors can be used and can in principle be extended to use in near field measurements.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Angelica Y. García-Jomaso, Dahi Ludim Hernandez-Roa, Ana Luz Muñoz-Rosas, Carlos G. Treviño-Palacios, Jesus Garduño-Mejía, Oleg Kolokoltsev, and Naser Qureshi "Interferometric detection for terahertz microscopy", Proc. SPIE 10917, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XII, 1091715 (1 March 2019); https://doi.org/10.1117/12.2510560
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