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1 March 2019 Zinc-oxide nanowires characterization using optical reflectance
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Proceedings Volume 10919, Oxide-based Materials and Devices X; 1091922 (2019)
Event: SPIE OPTO, 2019, San Francisco, California, United States
In this work, we propose a simple and time-saving method for the characterization of the ZnO-NWs. The method is based on the measurement of the spectral reflection of the ZnO-NWs in the UV-VIS-NIR ranges. Then the ZnO-NWs effective refractive index, and subsequently the density, and the length are obtained making use of the interference pattern contrast and periodicity in the reflection response versus wavelength. The extracted NWs length and density using the proposed method show good agreement with the SEM results. This characterization method opens the door for easy and cheap monitoring of the growth within microfluidic environment.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mazen Erfan, Martine Gnambodoe-Capochichi, Marie Le Pivert, Frédéric Marty, Yasser M. Sabry, Yamin Leprince-Wang, and Tarik Bourouina "Zinc-oxide nanowires characterization using optical reflectance", Proc. SPIE 10919, Oxide-based Materials and Devices X, 1091922 (1 March 2019); doi: 10.1117/12.2507935;


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