Modular test system for high-speed silicon photonics transceivers

R. Pitwon; L. O'Faolain

doi:10.1117/12.2514918

4 March 2019 Modular test system for high-speed silicon photonics transceivers

R. Pitwon, L. O'Faolain

Proceedings Volume 10924, Optical Interconnects XIX; 109240I (2019) https://doi.org/10.1117/12.2514918
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

We introduce a suite of modular test cards designed and developed on the H2020 COSMICC project to allow test and validation of a silicon photonics transceiver at up to 56 Gb/s. The modular test cards include large and small mezzanine cards to house the silicon photonics transceiver under test and a power distribution and sense card, which allows real time measurement of power consumption in a data center environment. The test modules can be driven stand-alone or incorporated into different data center platforms.

Conference Presentation

Citation Download Citation

R. Pitwon and L. O'Faolain "Modular test system for high-speed silicon photonics transceivers", Proc. SPIE 10924, Optical Interconnects XIX, 109240I (4 March 2019); https://doi.org/10.1117/12.2514918

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