Design, Development, and Fabrication of Photonic Instruments I
Proc. SPIE 10925, Optimization for as-built performance, 1092502 (4 March 2019); doi: 10.1117/12.2508062
Proc. SPIE 10925, Structural, Thermal, and Optical Performance (STOP) analysis of the NASA ARCSTONE instruments, 1092503 (4 March 2019); doi: 10.1117/12.2506656
Proc. SPIE 10925, Physical-optics simulation of optical interferometry systems (Conference Presentation), 1092504 (4 March 2019); doi: 10.1117/12.2509559
Proc. SPIE 10925, Lens design using grid-based surface optimization, 1092505 (4 March 2019); doi: 10.1117/12.2508801
Applications of Photonic Instruments
Proc. SPIE 10925, Sub-nanosecond time-gated camera based on a novel current-assisted CMOS image sensor, 1092506 (4 March 2019); doi: 10.1117/12.2509528
Proc. SPIE 10925, Focus adjustable motion-blur compensation method using deformable mirror, 1092507 (4 March 2019); doi: 10.1117/12.2509567
Proc. SPIE 10925, Active fiber-ring enhanced absorption gas spectroscopy using multi-longitudinal mode tunable laser in the NIR, 1092508 (4 March 2019); doi: 10.1117/12.2508406
Proc. SPIE 10925, Photothermal microscopy characterization of multiphoton annealing of defects in thin-film coatings for high-power lasers, 1092509 (4 March 2019); doi: 10.1117/12.2508904
Proc. SPIE 10925, Label-free 3D super-resolution nanoscope with large field-of-view, 109250A (4 March 2019); doi: 10.1117/12.2505622
Metrological Instrumentation I
Proc. SPIE 10925, Characterization of fiber optics with femtosecond-infrared fiber Bragg gratings for extreme applications (Conference Presentation), 109250C (4 March 2019); doi: 10.1117/12.2507001
Proc. SPIE 10925, Characterization of gradient index optical components using experimental ray tracing, 109250D (4 March 2019); doi: 10.1117/12.2511072
Proc. SPIE 10925, In-process monitoring of laser ablation on thin steel membranes by multispectral shape from-shading, 109250E (4 March 2019); doi: 10.1117/12.2511075
Proc. SPIE 10925, Analysis of HIMAP polarimeter (Conference Presentation), 109250F (4 March 2019); doi: 10.1117/12.2510750
Metrological Instrumentation II
Proc. SPIE 10925, High-resolution wave front phase sensor for silicon wafer metrology, 109250I (4 March 2019); doi: 10.1117/12.2505764
Proc. SPIE 10925, Absolute calibration of a Shack-Hartmann wavefront sensor for measurements of wavefronts, 109250K (7 March 2019); doi: 10.1117/12.2510047
Metrology, Characterization, and Fabrication of Photonic Instruments I
Proc. SPIE 10925, Thin-film characterization with a dual-channel dispersion-encoded imaging low-coherence interferometry approach, 109250L (7 March 2019); doi: 10.1117/12.2509676
Proc. SPIE 10925, Non-contact characterization of compound optical lenses using confocal microscopy and low-coherence interferometry (Conference Presentation), 109250M (4 March 2019); doi: 10.1117/12.2510811
Proc. SPIE 10925, Quantitative phase imaging for surface roughness measurements to demonstrate variation of quality factor in crystalline whispering-gallery mode resonators (Conference Presentation), 109250N (4 March 2019); doi: 10.1117/12.2509408
Proc. SPIE 10925, Chromatic line confocal technology in high-speed 3D surface-imaging applications , 109250O (4 March 2019); doi: 10.1117/12.2507962
Proc. SPIE 10925, An economical solution for high-throughput low-noise multi-channel spectroscopy , 109250P (4 March 2019); doi: 10.1117/12.2510901
Metrology, Characterization, and Fabrication of Photonic Instruments II
Proc. SPIE 10925, Precision metrology through wavelength-demultiplexed laser interferometry (Conference Presentation), 109250Q (4 March 2019); doi: 10.1117/12.2511031
Proc. SPIE 10925, Stress metrology for flexible and flat-panel display manufacturing (Conference Presentation), 109250R (4 March 2019); doi: 10.1117/12.2511183
Proc. SPIE 10925, Influence of numerical aperture (NA) on micro-reflectance spectroscopy, 109250S (4 March 2019); doi: 10.1117/12.2510619
Design, Development, and Fabrication of Photonic Instruments II
Proc. SPIE 10925, True OEM terahertz systems for industrial applications, 109250U (4 March 2019); doi: 10.1117/12.2511268
Proc. SPIE 10925, Multi-tone modulated continuous-wave lidar, 109250V (4 March 2019); doi: 10.1117/12.2507565
Proc. SPIE 10925, Performance analysis of linearly-swept frequency-modulated continuous-wave ladar, 109250W (4 March 2019); doi: 10.1117/12.2511546
Proc. SPIE 10925, Wavelength-locking of a semiconductor laser using an electronic technique, 109250X (4 March 2019); doi: 10.1117/12.2507260
Sensors and Ruggedized Systems
Proc. SPIE 10925, Hybrid sensor based on microstructured hollow-core fiber for simultaneous measurement of strain and temperature, 109250Z (4 March 2019); doi: 10.1117/12.2508288
Proc. SPIE 10925, A compact DUV spectrometer for wide-temperature entry, descent, and landing sensing applications, 1092510 (4 March 2019); doi: 10.1117/12.2508656
Proc. SPIE 10925, Simulation study of optical detection of small particles by light scattering-type sensor with double-side mirror reflectors, 1092511 (4 March 2019); doi: 10.1117/12.2508272
Proc. SPIE 10925, Vector Brillouin optical time-domain analysis with Raman amplification and optical pulse coding, 1092512 (4 March 2019); doi: 10.1117/12.2510972
Design, Development, and Fabrication of Photonic Instruments III
Proc. SPIE 10925, Lens in a voice coil: a compact design approach for z-scanners, 1092513 (4 March 2019); doi: 10.1117/12.2508614
Proc. SPIE 10925, A frequency-modulated laser interferometer for nanometer-scale position sensing at cryogenic temperatures, 1092514 (4 March 2019); doi: 10.1117/12.2508900
Posters-Wednesday
Proc. SPIE 10925, Electro-optic-based pressure measurement and transmitter using lithium niobate (LiNbO3) Mach-Zehnder modulator for industrial application, 1092516 (4 March 2019); doi: 10.1117/12.2506860
Proc. SPIE 10925, Polarized wavefront measurement using an electrically tunable focused plenoptic camera, 1092517 (4 March 2019); doi: 10.1117/12.2507759
Proc. SPIE 10925, New microcontroller unit improving stability and functionality of the optical chopper for atmospheric LIDAR, 1092518 (4 March 2019); doi: 10.1117/12.2508060
Proc. SPIE 10925, Development of separation inspection technique for micro-cracks and particles using non-contact stress-induced light scattering method, 1092519 (4 March 2019); doi: 10.1117/12.2508375
Proc. SPIE 10925, Microspectroscopy of nanomaterials, biological species, and live cells, 109251B (4 March 2019); doi: 10.1117/12.2510598
Proc. SPIE 10925, Characterization of performance of back-illuminated SCMOS cameras versus conventional SCMOS and EMCCD cameras for microscopy applications, 109251C (4 March 2019); doi: 10.1117/12.2510614
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