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4 March 2019 A compact DUV spectrometer for wide-temperature entry, descent, and landing sensing applications
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Proceedings Volume 10925, Photonic Instrumentation Engineering VI; 1092510 (2019) https://doi.org/10.1117/12.2508656
Event: SPIE OPTO, 2019, San Francisco, California, United States
Abstract
NASA has described the need for rugged, compact spectrometers for deep ultraviolet (DUV) analysis of atmospheric properties during the entry, descent, and landing (EDL) phase of the mission profile for planetary landing craft. The EDL phase presents a brief opportunity to gather useful altitude profiles of atmospheric components and pressures. However, EDL is a high-risk phase and presents severe challenges to instrument design, including large temperature changes over short periods and payload restrictions. Therefore, the preferred features of an EDL spectrometer are compact design, stable performance across wide temperatures, DUV sensitivity, and simple temperature management systems. In this paper, a compact EDL spectrometer is described, which includes the system-level optical design and analysis of the novel silicon-carbide integrated circuits.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Waylin J. Wing, Jim Holmes, Nicholas Chiolino, Paul Bourget, Sonia Perez, Matthew Barlow, and A. Matt Francis "A compact DUV spectrometer for wide-temperature entry, descent, and landing sensing applications", Proc. SPIE 10925, Photonic Instrumentation Engineering VI, 1092510 (4 March 2019); https://doi.org/10.1117/12.2508656
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