Transient extreme ultraviolet measurement of element-specific charge transfer dynamics in multiple-material junctions

Jonathan M. Michelsen; William T. Denman; Scott K. Cushing

doi:10.1117/12.2507473

1 February 2019 Transient extreme ultraviolet measurement of element-specific charge transfer dynamics in multiple-material junctions

Jonathan M. Michelsen, William T. Denman, Scott K. Cushing

Author Affiliations +

Proceedings Volume 10926, Quantum Sensing and Nano Electronics and Photonics XVI; 109262A (2019) https://doi.org/10.1117/12.2507473
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

The absorption of solid state materials in complex photonic and optoelectronic devices overlap in the visible spectrum. Due to the overlap of spectral features, ultrafast measurements of charge carrier dynamics and transport is obscured. Here, the element specificity of transient extreme ultraviolet (XUV) spectroscopy is advanced as a probe for studying photoexcited charge transport in multiple-material junctions. The core-hole excited by the XUV transitions also imparts structural information on to the probed electronic transition. Transient XUV can therefore measure electron and averaged phonon dynamics for each elemental species in a junction. Application to polaron measurement in α-Fe₂O₃, valley-specific scattering in Si, and charge transfer in a nanoscale Ni-TiO₂-Si junction will be discussed.

Conference Presentation

Citation Download Citation

Jonathan M. Michelsen, William T. Denman, and Scott K. Cushing "Transient extreme ultraviolet measurement of element-specific charge transfer dynamics in multiple-material junctions", Proc. SPIE 10926, Quantum Sensing and Nano Electronics and Photonics XVI, 109262A (1 February 2019); https://doi.org/10.1117/12.2507473

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