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4 March 2019 3D scanning by means of dual-projector structured light illumination
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Abstract
This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ying Yu, Daniel L. Lau, and Matthew P. Ruffner "3D scanning by means of dual-projector structured light illumination", Proc. SPIE 10932, Emerging Digital Micromirror Device Based Systems and Applications XI, 109320M (4 March 2019); https://doi.org/10.1117/12.2510990
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