PROCEEDINGS VOLUME 10934
SPIE OPTO | 2-7 FEBRUARY 2019
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
IN THIS VOLUME

24 Sessions, 37 Papers, 53 Presentations
Proceedings Volume 10934 is from: Logo
SPIE OPTO
2-7 February 2019
San Francisco, California, United States
Front Matter: Volume 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093401 (16 April 2019); doi: 10.1117/12.2531112
Sensing Temperature, Electric Field, and Magnetic Field
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093402 (26 March 2019); doi: 10.1117/12.2515591
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093403 (4 March 2019); doi: 10.1117/12.2507056
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093404 (4 March 2019); doi: 10.1117/12.2507057
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093405 (4 March 2019); doi: 10.1117/12.2515662
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093406 (1 March 2019); doi: 10.1117/12.2515587
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093407 (26 March 2019); doi: 10.1117/12.2515410
Sensing Applications of Optomechanics and Nanophotonics
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093409 (4 March 2019); doi: 10.1117/12.2515413
Optical Rotation Sensing, Accelerometry, and Fast Light I
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340C (4 March 2019); doi: 10.1117/12.2514644
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340E (4 March 2019); doi: 10.1117/12.2515397
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340G (4 March 2019); doi: 10.1117/12.2514648
Sensing Application of Optical Fibers
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340I (4 March 2019); doi: 10.1117/12.2508094
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340J (4 March 2019); doi: 10.1117/12.2515595
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340K (1 March 2019); doi: 10.1117/12.2515598
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340L (1 March 2019); doi: 10.1117/12.2515633
Sensing Applications of NV Diamond
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340N (5 March 2019); doi: 10.1117/12.2515399
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340O (1 March 2019); doi: 10.1117/12.2515427
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340P (1 March 2019); doi: 10.1117/12.2515721
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340Q (1 March 2019); doi: 10.1117/12.2516596
Optical Rotation Sensing, Accelerometry, and Fast Light II
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340S (1 March 2019); doi: 10.1117/12.2515793
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340T (4 March 2019); doi: 10.1117/12.2515657
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340U (1 March 2019); doi: 10.1117/12.2515411
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340V (1 March 2019); doi: 10.1117/12.2515797
Slow Light for Sensing
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340W (5 March 2019); doi: 10.1117/12.2515395
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340Y (1 March 2019); doi: 10.1117/12.2516606
Atomic Processes for Sensing
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109340Z (5 March 2019); doi: 10.1117/12.2515604
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093411 (1 March 2019); doi: 10.1117/12.2515424
New Directions in Precision Metrology I
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093415 (4 March 2019); doi: 10.1117/12.2515430
New Directions in Precision Metrology II
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341B (1 March 2019); doi: 10.1117/12.2515594
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341C (4 March 2019); doi: 10.1117/12.2512838
New Directions in Precision Metrology III
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341G (1 March 2019); doi: 10.1117/12.2514802
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341H (1 March 2019); doi: 10.1117/12.2514823
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341I (4 March 2019); doi: 10.1117/12.2520176
Entanglement-Enhanced Precision Metrology I: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341J (1 March 2019); doi: 10.1117/12.2511587
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341K (5 March 2019); doi: 10.1117/12.2511977
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341L (1 March 2019); doi: 10.1117/12.2512490
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341M (1 March 2019); doi: 10.1117/12.2513749
Entanglement-Enhanced Precision Metrology II: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341N (1 March 2019); doi: 10.1117/12.2511835
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341O (1 March 2019); doi: 10.1117/12.2512343
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341P (1 March 2019); doi: 10.1117/12.2514459
Entanglement-Enhanced Precision Metrology III: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341Q (5 March 2019); doi: 10.1117/12.2514789
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341R (1 March 2019); doi: 10.1117/12.2515497
Entanglement-Enhanced Precision Metrology IV: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341V (1 March 2019); doi: 10.1117/12.2508555
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341W (5 March 2019); doi: 10.1117/12.2515502
Matter-wave Interferometry I
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341X (1 March 2019); doi: 10.1117/12.2515457
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341Z (5 March 2019); doi: 10.1117/12.2515426
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093420 (5 March 2019); doi: 10.1117/12.2511763
Matter-wave Interferometry II
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093424 (5 March 2019); doi: 10.1117/12.2515512
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093425 (1 March 2019); doi: 10.1117/12.2515469
Optical and Atomic Clocks I
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093429 (5 March 2019); doi: 10.1117/12.2515798
Optical and Atomic Clocks II
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342B (1 March 2019); doi: 10.1117/12.2515582
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342C (5 March 2019); doi: 10.1117/12.2515506
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342E (1 March 2019); doi: 10.1117/12.2516612
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342F (1 March 2019); doi: 10.1117/12.2506225
Entanglement-Enhanced Precision Metrology V: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342G (1 March 2019); doi: 10.1117/12.2516616
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342I (5 March 2019); doi: 10.1117/12.2515680
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342J (5 March 2019); doi: 10.1117/12.2515422
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342K (5 March 2019); doi: 10.1117/12.2515415
Entanglement-Enhanced Precision Metrology VI. Spin Squeezing: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342L (5 March 2019); doi: 10.1117/12.2515486
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342N (5 March 2019); doi: 10.1117/12.2515947
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342O (5 March 2019); doi: 10.1117/12.2514791
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342P (1 March 2019); doi: 10.1117/12.2515795
Entanglement-Enhanced Precision Metrology VII: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342Q (1 March 2019); doi: 10.1117/12.2516608
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342S (1 March 2019); doi: 10.1117/12.2515204
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342T (5 March 2019); doi: 10.1117/12.2515661
Entanglement-Enhanced Precision Metrology VIII: Joint Session with Conferences 10933 and 10934
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342U (5 March 2019); doi: 10.1117/12.2515610
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342V (5 March 2019); doi: 10.1117/12.2515421
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342W (1 March 2019); doi: 10.1117/12.2515655
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342X (1 March 2019); doi: 10.1117/12.2515408
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