Speckle-based spectrometer (Conference Presentation)

Hui Cao

doi:10.1117/12.2515430

4 March 2019 Speckle-based spectrometer (Conference Presentation)

Hui Cao

Proceedings Volume 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology; 1093415 (2019) https://doi.org/10.1117/12.2515430
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

A speckle pattern denotes a random granular distribution of intensity generated, e.g., by light scattered from a disordered structure or transmitted through a multimode fiber. Its spectral sensitivity has been used to retrieve the spectrum of light that creates it. We have developed three types of speckle-based spectrometers. The first one is a chip-scale random spectrometer that enhances spectral sensitivity by multiple scattering of light. The second type utilizes a multimode optical fiber to achieve the record-high resolution. The third one is based on an evanescently-coupled multimode spiral waveguide. The speckle-based spectrometer has been applied to the ultrahigh-resolution frequency-comb spectroscopy.

Conference Presentation

Citation Download Citation

Hui Cao "Speckle-based spectrometer (Conference Presentation)", Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093415 (4 March 2019); https://doi.org/10.1117/12.2515430

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