Single-photon quantum metrology (Conference Presentation)

Thomas Gerrits

doi:10.1117/12.2511977

5 March 2019 Single-photon quantum metrology (Conference Presentation)

Thomas Gerrits

Proceedings Volume 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology; 109341K (2019) https://doi.org/10.1117/12.2511977
Event: SPIE OPTO, 2019, San Francisco, California, United States

Abstract

We will present our current efforts on single photon quantum metrology using high-efficiency superconducting detectors and high-efficiency single-photon sources based on spontaneous parametric downconversion. Optical power measurements based on single photon counting could establish a quantum standard for optical power calibration in the future. At NIST we are pursuing the development of single photon sources and single photon detectors for metrology, quantum and classical applications. As part of these efforts, we are pursuing the establishment of a measurement service for the calibration of single photon detectors. We present how our calibration is tied to the calibration of our transfer standard optical fiber power meters. Using the beamsplitter method, we have implemented a fiber-coupled and free-space measurement system. Also, we have developed testbeds and measurement protocols for the characterization of single photon sources and single photon detectors. We will review several methods, which allow for the characterization of the spatial and spectral degree of freedom in spontaneous parametric downconversion.

Conference Presentation

Citation Download Citation

Thomas Gerrits "Single-photon quantum metrology (Conference Presentation)", Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109341K (5 March 2019); https://doi.org/10.1117/12.2511977

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