Translator Disclaimer
5 March 2019 Interaction-free ghost-imaging of structured objects (Conference Presentation)
Author Affiliations +
Abstract
Correlated light (either classical or quantum) can be employed in various ways to improve resolution and measurement sensitivity. In an “interaction-free” measurement, a single photon can be used to reveal the presence of an object placed within one arm of an interferometer without being absorbed by it. This method has previously been applied to imaging. With a technique known as “ghost imaging”, entangled photon pairs are used for detecting an opaque object with significantly improved signal-to-noise ratio while preventing over-illumination. Here, we integrate these two methods to obtain a new imaging technique which we term “interaction-free ghost-imaging” that possesses the benefits of both techniques. While improving the image quality of conventional ghost-imaging, this new technique is also sensitive to phase and polarization changes in the photons introduced by a structured object. Furthermore, thanks to the “interaction-free” nature of this new technique, it is possible to reduce the number of photons required to produce a clear image of the object (which could be otherwise damaged by the photons) making this technique superior for probing light-sensitive materials and eventually biological tissues. If time allows, I will discuss some follow-up works involving partial measurements and remote erasure/completion of images. The latter techniques can help to suppress various types of noise during the imaging process.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yingwen Zhang, Alicia Sit, Frédéric Bouchard, Hugo Larocque, Eliahu Cohen, Avshalom C. Elitzur, James L. Harden, Robert W. Boyd, and Ebrahim Karimi "Interaction-free ghost-imaging of structured objects (Conference Presentation)", Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342J (5 March 2019); doi: 10.1117/12.2515422; https://doi.org/10.1117/12.2515422
PROCEEDINGS
PRESENTATION ONLY


SHARE
Advertisement
Advertisement
Back to Top