21 March 1989 Honeyshell: A Flexible Expert System For Defect And Cause Analysis For Wave Soldering
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Abstract
An expert system for diagnosis of defect and analysis of cause in manufacturing an integrated circuit board (IC board) has been designed and built. The system architecture supports emulation of two important aspects of expert's problem solving. The first aspect concerns expert's ability to diagnose the defect quickly after a cursory examination of the IC Board. The second aspect concerns expert's ability to refocus his attention on likely defect candidates quickly if his initial considerations fail. Our approach uses rule classification and system architecture to accomplish this. The additional benefits are faster response time, dramatic reduction in the size of the rule base and the ability for the user to select level of expertise in this expert system to match his own level.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rajsbekhar D. Oza, Rajsbekhar D. Oza, Pravir Malik, Pravir Malik, } "Honeyshell: A Flexible Expert System For Defect And Cause Analysis For Wave Soldering", Proc. SPIE 1095, Applications of Artificial Intelligence VII, (21 March 1989); doi: 10.1117/12.969338; https://doi.org/10.1117/12.969338
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