Paper
21 March 1989 Versatile Printed Wiring Board Pattern Inspection Algorithm: Radial Matching
Satoshi Iwata, Moritoshi Ando, Takefumi Inagaki
Author Affiliations +
Abstract
We have developed versatile pattern inspection algorithm that we call Radial Matching, which generates pattern code. dictionaries and enables many different patterns to be inspected by changing dictionary contents. The system inspects all defect type analyzing pattern attributes and connections without referencing layout artwork. It measures a copper pattern radially in eight directions. Sensors are 22.5 degrees apart. Length and orientation data are converted 16-bit codes that can express all printed wiring board (1)V1B) patterns, containing ordinal patterns and defects. Dictionaries are generated when 'PWB patterns are inspected and good and defective codes are classified., These features enable a code dictionary to be generated using only the first PWB. Experiments show that original pat terns can be described using 27% of the codes. Code classification for inspection can be done on a 100 mm2 area. The new algorithm has been implemented a system in use at a Fujitsu plant.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Satoshi Iwata, Moritoshi Ando, and Takefumi Inagaki "Versatile Printed Wiring Board Pattern Inspection Algorithm: Radial Matching", Proc. SPIE 1095, Applications of Artificial Intelligence VII, (21 March 1989); https://doi.org/10.1117/12.969363
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Cited by 1 scholarly publication.
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KEYWORDS
Inspection

Sensors

Associative arrays

Copper

Evolutionary algorithms

Computer aided design

Algorithm development

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