Three-dimensional measurement system based on structured light and error correction

Wenkang Wu; Yongjun Wang; Tingting Yu; Hongyan Zhao; Xinyu Liu; Yucheng Pan; Xiaoyuan Niu; Jun Li; Hui Xu; Xiangjun Xin

doi:10.1117/12.2506346

15 November 2018 Three-dimensional measurement system based on structured light and error correction

Wenkang Wu, Yongjun Wang, Tingting Yu, Hongyan Zhao, Xinyu Liu, Yucheng Pan, Xiaoyuan Niu, Jun Li, Hui Xu, Xiangjun Xin

Proceedings Volume 10964, Tenth International Conference on Information Optics and Photonics; 109645G (2018) https://doi.org/10.1117/12.2506346
Event: Tenth International Conference on Information Optics and Photonics (CIOP 2018), 2018, Beijing, China

Abstract

This paper introduces one three-dimensional measurement system which based on structured light. This system has the advantages of high precision, high speed, and simple structure. In the three-dimensional measurement system based on structured light, the solution phase is one of the key steps. Phase jump, shadow and other errors will have a great impact on the final point cloud computing. This paper explains the three-dimensional measurement system, then also made an error analysis and proposed a corresponding solution. The reasons for the phase jump were analyzed and the corresponding solutions were proposed. This paper also analyzes the cause of random error and proposes a solution. The final accuracy was improved. This has important applications in contour extraction in workpiece repair and autopilot.

Citation Download Citation

Wenkang Wu, Yongjun Wang, Tingting Yu, Hongyan Zhao, Xinyu Liu, Yucheng Pan, Xiaoyuan Niu, Jun Li, Hui Xu, and Xiangjun Xin "Three-dimensional measurement system based on structured light and error correction ", Proc. SPIE 10964, Tenth International Conference on Information Optics and Photonics, 109645G (15 November 2018); https://doi.org/10.1117/12.2506346

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