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1 April 2019 Prediction of the amplitude of ultrasound reflection from rough defects (Conference Presentation)
Michael Lowe, Fan Shi, Stewart Haslinger, Peter Huthwaite, Richard Craster
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Proceedings Volume 10972, Health Monitoring of Structural and Biological Systems XIII; 109720K (2019) https://doi.org/10.1117/12.2514546
Event: SPIE Smart Structures + Nondestructive Evaluation, 2019, Denver, Colorado, United States
Abstract
Confidence in the ability to find defects in NDE and SHM using ultrasound depends on knowlege of the strength of the reflection of the ultrasound from the defect. Roughness of a defect, such as on the surface of a crack, has a strong effect on the reflection, but every rough defect has a different surface, so the usual methods of assessing the sensitivity of inspection cannot be used. Research at Imperial College has pursued a stochastic approach to predict the statistical expected scattering. The talk will provide a summary of the method, its results, and its validation using numerical modelling.
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Michael Lowe, Fan Shi, Stewart Haslinger, Peter Huthwaite, and Richard Craster "Prediction of the amplitude of ultrasound reflection from rough defects (Conference Presentation)", Proc. SPIE 10972, Health Monitoring of Structural and Biological Systems XIII, 109720K (1 April 2019); https://doi.org/10.1117/12.2514546
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KEYWORDS
Reflection
Ultrasonography
Inspection
Nondestructive evaluation
Numerical modeling
Scattering
Stochastic processes
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