Translator Disclaimer
13 May 2019 Angle dependent scatter in CVD ZnSe and single crystal CaF2 from the infrared through the NIR
Author Affiliations +
Abstract
The data reported in journals on angle resolved scatter measurements for highly transparent window materials is scarce. An experimental facility with enough sensitivity to measure such low level scatter is described. A dynamic range of at least eight orders of magnitude is required to measure the peak of the specular component down to the random diffuse component far removed from the specular direction. Single crystal CaF2 and polycrystalline CVD ZnSe are measured at wavelengths from the visible to the midwave infrared. The use of thick and thin samples allows the distinction between surface scatterance and bulk scatter.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. B. Airola, M. E. Thomas, J. Ma, D. V. Hahn, K. Hibbitts, and D. Blaney "Angle dependent scatter in CVD ZnSe and single crystal CaF2 from the infrared through the NIR", Proc. SPIE 10985, Window and Dome Technologies and Materials XVI, 1098504 (13 May 2019); https://doi.org/10.1117/12.2519457
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Optical properties of diamond
Proceedings of SPIE (September 27 1994)
Reflectivities and electronic band structure of Hg0.8Cd0.2Te
Proceedings of SPIE (September 24 1996)
Effects of defects on ZnSe absorption and transmission
Proceedings of SPIE (June 26 1997)
Optical properties of KRS-5
Proceedings of SPIE (June 26 1997)

Back to Top