Parametric modeling of surface-distributed-scatterer ensembles for inverse analysis of diffuse-reflectance spectra

R. Furstenberg; A. Shabaev; C. A. Kendziora; Y. Kim; R. A. McGill; C. Breshike; S. G. Lambrakos

doi:10.1117/12.2518718

14 May 2019 Parametric modeling of surface-distributed-scatterer ensembles for inverse analysis of diffuse-reflectance spectra

R. Furstenberg, A. Shabaev, C. A. Kendziora, Y. Kim, R. A. McGill, C. Breshike, S. G. Lambrakos

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Proceedings Volume 10986, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV; 109860Q (2019) https://doi.org/10.1117/12.2518718
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States

Abstract

This study examines using parametric models for inverse analysis of diffuse IR reflectance from particulate materials that are sparsely distributed upon a surface. Parametric models are applied for inverse analysis of simulated spectra, which are calculated using ensembles of reflectance spectra for non-interacting material particles on surfaces, which have specified dielectric response properties and particle-size distributions Simulated reflectance spectra for individual particles upon surfaces, used for prototype inverse analysis, are calculated numerically using a model based on Mie scattering theory, which assumes spherical particles on surfaces. Parametric models of diffuse reflectance spectra provide encoding of dielectric response features for physical interpretation and convenien representation.

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R. Furstenberg, A. Shabaev, C. A. Kendziora, Y. Kim, R. A. McGill, C. Breshike, and S. G. Lambrakos "Parametric modeling of surface-distributed-scatterer ensembles for inverse analysis of diffuse-reflectance spectra", Proc. SPIE 10986, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV, 109860Q (14 May 2019); https://doi.org/10.1117/12.2518718

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