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13 May 2019 Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique
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Abstract
This research proposes a motion-induced error reduction method for phase shifting profilomtry. Particularly, each illuminated fringe pattern will be captured twice in one projection cycle when imaging a highly dynamic scene, resulting in two sets of phase shifted fringe images be obtained. A phase map will be computed for each phase shifting set in preparation for error analysis. Finally, motion-induced phase errors will be compensated by examining the difference of the two phase maps obtained respectively from two phase shifting sets. This method uses defocused 1-bit binary patterns to bypass rigid camera-projector synchronization, which has potential for high-speed applications.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vignesh Suresh, Yajun Wang, and Beiwen Li "Motion-induced error reduction for phase shifting profilometry using double-shot-in-single-illumination technique", Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 1099108 (13 May 2019); https://doi.org/10.1117/12.2518319
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