Paper
12 March 2019 Morphology study of ZnTe crystals grown from Te-rich solution
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Proceedings Volume 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application; 110233C (2019) https://doi.org/10.1117/12.2517301
Event: Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 2018, Xi'an, China
Abstract
Scanning electron microscope (SEM) was used as a powerful tool to analyze the morphology of ZnTe crystals grown from Te solution. ZnTe crystals found on the end of ZnTe ingot are with micron- to submilimeter size, and their shapes can generally be classified into polyhedral type with smooth facets, and skeletal type with concave faces. The morphology formation mechanisms were discussed. It was found, the ZnTe crystal shape and surface morphology is very sensitive to the growth condition. In spite of the thermodynamics factor (Gibbs free energy theory), the kinetic factors, such as the crystal size and crystalline driving force, play more essential roles in the control of the shape of ZnTe crystals.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rui Yang "Morphology study of ZnTe crystals grown from Te-rich solution", Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110233C (12 March 2019); https://doi.org/10.1117/12.2517301
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KEYWORDS
Crystals

Crystallography

Tellurium

Scanning electron microscopy

Semiconducting wafers

Thermodynamics

Diffusion

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